- 专利标题: MEASUREMENT METHOD FOR CHARACTERIZATION OF A PHOTODETECTOR
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申请号: US18564177申请日: 2022-03-31
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公开(公告)号: US20240247977A1公开(公告)日: 2024-07-25
- 发明人: Gerd PLECHINGER
- 申请人: ams-OSRAM International GmbH
- 申请人地址: DE Regensburg
- 专利权人: ams-OSRAM International GmbH
- 当前专利权人: ams-OSRAM International GmbH
- 当前专利权人地址: DE Regensburg
- 优先权: DE 2021113849.3 2021.05.28
- 国际申请: PCT/EP2022/058518 2022.03.31
- 进入国家日期: 2023-11-27
- 主分类号: G01J1/08
- IPC分类号: G01J1/08 ; G01J1/44
摘要:
A measurement method for characterization of a photodetector includes illumination of the photodetector with a variable electromagnetic radiation. The variable electromagnetic radiation has a temporally oscillating radiation intensity with fixed period and amplitude. The method also includes illumination of the photodetector with a first electromagnetic radiation having a temporally constant first radiation intensity and measurement of a first output signal at the photodetector. The method further includes illumination of the photodetector with a second electromagnetic radiation having a temporally constant second radiation intensity different from the first radiation intensity and measurement of a second output signal at the photodetector. The method additionally includes determination of a non-linearity of the photodetector by comparing the measurements of the first and second output signals.
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