Invention Publication
- Patent Title: LOCOS OR SIBLK TO PROTECT DEEP TRENCH POLYSILICON IN DEEP TRENCH AFTER STI PROCESS
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Application No.: US17877976Application Date: 2022-07-31
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Publication No.: US20240038580A1Publication Date: 2024-02-01
- Inventor: Hao Yang , Asad Haider , Guruvayurappan Mathur , Abbas Ali , Alexei Sadovnikov , Umamaheswari Aghoram
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L29/06

Abstract:
An electronic device includes a semiconductor substrate and a semiconductor surface layer having a first conductivity type, the semiconductor surface layer over the semiconductor substrate and having a top surface, a buried layer having an opposite second conductivity type between the semiconductor surface layer and the semiconductor substrate, a dielectric isolation layer that extends over and into the semiconductor surface layer, a deep trench structure that extends through the dielectric isolation layer into the semiconductor surface layer, and a silicide blocking layer on a top surface of the deep trench structure.
Information query
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