Invention Application
- Patent Title: SPARSE BACKGROUND MEASUREMENT AND CORRECTION FOR IMPROVING IMAGING
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Application No.: US17383740Application Date: 2021-07-23
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Publication No.: US20230026441A1Publication Date: 2023-01-26
- Inventor: Chuanyong Bai , Robert Zahn , Daniel Gagnon , Amit Jain , Zhicong Yu , Georgios Prekas
- Applicant: Accuray, Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Accuray, Inc.
- Current Assignee: Accuray, Inc.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G06T11/00
- IPC: G06T11/00 ; A61B6/00 ; A61B6/03 ; A61B6/02

Abstract:
Disclosed herein is an imaging system including a first x-ray source configured to produce first x-ray photons in a first energy range suitable for imaging, project the first x-ray photons onto an area designated for imaging, a rotatable gantry configured to rotate the first x-ray source such that the first x-ray source traverses an angular path, and a data processor having an analytical portion. The analytical portion is configured to collect first data relating to the transmission of the first x-ray photons through the area designated for imaging at a set of image-collection angles along the angular path, collect background data at a set of background-collection angles along the angular path, wherein the system acquires more than one image of the designated area for imaging between background angles. The analytical portion is also configured to remove errors in the first data using the background data, and generate a corrected image based on the removal of errors in the first data.
Public/Granted literature
- US11854123B2 Sparse background measurement and correction for improving imaging Public/Granted day:2023-12-26
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T11/00 | 2D〔二维〕图像的生成 |