- 专利标题: METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
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申请号: US17219627申请日: 2021-03-31
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公开(公告)号: US20220317067A1公开(公告)日: 2022-10-06
- 发明人: Bart BUIJSSE , Hans RAAIJMAKERS , Peter Christiaan TIEMEIJER
- 申请人: FEI Company
- 申请人地址: US OR Hillsboro
- 专利权人: FEI Company
- 当前专利权人: FEI Company
- 当前专利权人地址: US OR Hillsboro
- 主分类号: G01N23/2055
- IPC分类号: G01N23/2055 ; G01N23/207 ; G01N23/20025
摘要:
Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.
公开/授权文献
- US11988618B2 Method and system to determine crystal structure 公开/授权日:2024-05-21
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