Invention Application
- Patent Title: DEFECT ENHANCEMENT
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Application No.: US16655459Application Date: 2019-10-17
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Publication No.: US20210118141A1Publication Date: 2021-04-22
- Inventor: JingChang Huang , Sheng Nan Zhu , Fan Li , Peng Ji , Jian Xu , Wei Zhao , Jinfeng Li
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: G06T7/11
- IPC: G06T7/11 ; H04N13/122 ; G02B27/01 ; G06K9/00 ; G09G3/20 ; G09G3/36 ; G02F1/13

Abstract:
The present invention relates to a method, system and computer program product for defect enhancement. According to the method, a plurality of proposed regions from a plurality of images taken for a display panel is obtained. Each of proposed region of the plurality of proposed regions include a suspected defect on the display panel. At least two proposed regions from the plurality of proposed regions that deserve to be superimposed based on a set of conditions is determined. The at least two proposed regions for acquiring an enhanced defect are superimposed.
Public/Granted literature
- US11587233B2 Display panel defect enhancement Public/Granted day:2023-02-21
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