Invention Application
- Patent Title: METAL INTERCONNECT STRUCTURE AND METHOD FOR FABRICATING THE SAME
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Application No.: US16992055Application Date: 2020-08-12
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Publication No.: US20200373198A1Publication Date: 2020-11-26
- Inventor: Yi-How Chou , Tzu-Hao Fu , Tsung-Yin Hsieh , Chih-Sheng Chang , Shih-Chun Tsai , Kun-Chen Ho , Yang-Chou Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Priority: CN201810933058.X 20180816
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522 ; H01L23/532

Abstract:
A method for fabricating metal interconnect structure includes the steps of: forming a first metal interconnection in a first inter-metal dielectric (IMD) layer on a substrate; forming a cap layer on the first metal interconnection; forming a second IMD layer on the cap layer; performing a first etching process to remove part of the second IMD layer for forming an opening; performing a plasma treatment process; and performing a second etching process to remove polymers from bottom of the opening.
Public/Granted literature
- US11450558B2 Metal interconnect structure and method for fabricating the same Public/Granted day:2022-09-20
Information query
IPC分类: