Characterization of a Venting State or Other System Parameter that Affects the Characterization of a Force Applied to a Device
摘要:
An electronic device includes a pressure sensor and a processor. The pressure sensor is disposed within an interior volume of the electronic device and configured to generate a time-dependent sequence of measurements related to a force applied to the electronic device. The processor is configured to characterize, using at least the time-dependent sequence of measurements, a venting state of the interior volume. In some embodiments, the electronic device may also include a capacitive force sensor disposed to detect distortion of the interior volume. A second time-dependent sequence of measurements related to the force may be generated by the capacitive force sensor, and used by the processor to characterize the venting state of the interior volume.
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