Invention Application
- Patent Title: Method for Manufacturing a Semiconductor Device
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Application No.: US16192277Application Date: 2018-11-15
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Publication No.: US20190148217A1Publication Date: 2019-05-16
- Inventor: Andreas Moser , Matteo Dainese , Matthias Kuenle , Hans-Joachim Schulze
- Applicant: Infineon Technologies AG
- Priority: DE102017127010.8 20171116
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/324 ; H01L21/02 ; H01L21/78

Abstract:
An embodiment of a method for manufacturing a semiconductor device includes: providing a monocrystalline semiconductor substrate having a first side; forming a plurality of recess structures in the semiconductor substrate at the first side; filling the recess structures with a dielectric material to form dielectric islands in the recess structures; forming a semiconductor layer on the first side of the semiconductor substrate to cover the dielectric islands; and subjecting the semiconductor layer to heat treatment and recrystallizing the semiconductor layer to form a recrystallized semiconductor layer, so that a crystal structure of the recrystallized semiconductor layer adapts to a crystal structure of the semiconductor substrate, and so that the semiconductor substrate and the semiconductor layer together form a compound wafer with the dielectric islands at least partially buried in the semiconductor material of the compound wafer.
Public/Granted literature
- US10825716B2 Method for manufacturing a semiconductor device Public/Granted day:2020-11-03
Information query
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