Invention Application
- Patent Title: METHOD FOR FORMING CONTACT PLUG LAYOUT
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Application No.: US15479271Application Date: 2017-04-04
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Publication No.: US20180260510A1Publication Date: 2018-09-13
- Inventor: Ying-Chiao Wang , Yu-Cheng Tung , Chien-Ting Ho , Li-Wei Feng , Emily SH Huang
- Applicant: UNITED MICROELECTRONICS CORP. , Fujian Jinhua Integrated Circuit Co., Ltd.
- Priority: CN201710137695.1 20170309
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H01L27/02 ; H01L27/108

Abstract:
A method for forming a contact plug layout include following steps. (a) Receiving a plurality of active region patterns and a plurality of buried gate patterns that are parallel with each other, and each active region pattern overlaps two buried gate patterns to form two overlapping regions and one contact plug region in between the two overlapping regions in each active region pattern; and (b) forming a contact plug pattern in each contact plug region, the contact plug pattern respectively includes a parallelogram, and an included angle of the parallelogram is not equal to 90°. The contact plug pattern in each active region pattern partially overlaps the two buried gate pattern, respectively. The step (a) to the step (b) are implemented using a computer.
Public/Granted literature
- US10169521B2 Method for forming contact plug layout Public/Granted day:2019-01-01
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