Invention Application
- Patent Title: INSULATING LAYER NEXT TO FIN STRUCTURE AND METHOD OF REMOVING FIN STRUCTURE
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Application No.: US15445928Application Date: 2017-02-28
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Publication No.: US20180226403A1Publication Date: 2018-08-09
- Inventor: Shin-Chi Chen , Chih-Chung Chen , An-Chi Liu , Chih-Yueh Li , Pei-Ching Yeh , Tsung-Chieh Yang
- Applicant: UNITED MICROELECTRONICS CORP.
- Priority: CN201710070806.1 20170209
- Main IPC: H01L27/088
- IPC: H01L27/088 ; H01L29/06 ; H01L21/8234 ; H01L21/311 ; H01L21/3065 ; H01L21/308 ; H01L21/306

Abstract:
A method of removing a fin structure includes providing a substrate. A fin structure extends from the substrate. A mask layer is disposed on a top surface of the fin structure. An organic dielectric layer covers the substrate, the fin structure and the mask layer. A first etching process is performed to entirely remove the mask layer by taking the organic dielectric layer as a mask. Then a second etching process is performed to remove the fin structure. The first etching process is preferably an anisotropic etching process, and the second etching process is an isotropic etching process.
Public/Granted literature
- US10276443B2 Insulating layer next to fin structure and method of removing fin structure Public/Granted day:2019-04-30
Information query
IPC分类: