Invention Application
- Patent Title: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
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Application No.: US15678586Application Date: 2017-08-16
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Publication No.: US20170345806A1Publication Date: 2017-11-30
- Inventor: Yoshiaki Takemoto
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: H01L25/18
- IPC: H01L25/18 ; H01L23/528 ; H01L23/522 ; H01L23/532 ; H01L21/321

Abstract:
A semiconductor device includes a first substrate, an insulation layer, and a first electrode. The first substrate contains a first semiconductor material. The insulation layer includes a first surface, a second surface, and a third surface. The first electrode includes a fourth surface, a fifth surface, and a sixth surface, and contains a porous first conductive material. The second surface and the fifth surface configure the same surface. The third surface faces the sixth surface. A distance between the first surface and the first substrate is less than a distance between the second surface and the first substrate. A distance between the fourth surface and the first substrate is less than a distance between the fifth surface and the first substrate.
Information query
IPC分类: