Invention Application
- Patent Title: OVERLAY MASK
-
Application No.: US15260322Application Date: 2016-09-09
-
Publication No.: US20170115579A1Publication Date: 2017-04-27
- Inventor: Che-Yi Lin , En-Chiuan Liou , Yi-Jing Wang , Chia-Hsun Tseng
- Applicant: UNITED MICROELECTRONICS CORP.
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
An overlay mask includes a plurality of first patterns, a plurality of second patterns and a plurality of third patterns. The first patterns are arranged within a first pitch. The second patterns are arranged within a second pitch. A first portion of the third patterns are arranged alternately with the first patterns, within the first pitch, and a second portion of the third patterns are arranged alternately with the second patterns, within the second pitch, and the first pitch is not equal to the second pitch.
Public/Granted literature
- US09746786B2 Overlay mask Public/Granted day:2017-08-29
Information query
IPC分类: