Invention Application
- Patent Title: LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
- Patent Title (中): LITHOGRAPHIC装置和装置制造方法
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Application No.: US15306982Application Date: 2015-03-17
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Publication No.: US20170052463A1Publication Date: 2017-02-23
- Inventor: Gerardus Arnoldus Hendricus Franciscus JANSSEN , Martijn VAN BAREN
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Priority: EP14166492.0 20140430
- International Application: PCT/EP2015/055549 WO 20150317
- Main IPC: G03F7/20
- IPC: G03F7/20 ; H01L21/67 ; H01L21/677

Abstract:
A substrate handling system includes: a thermal shield for thermally insulating a space through which a substrate passes, from a thermal load originating outside the space, the thermal shield including: a first wall and a second wall with a gap therebetween, the first wall positioned between the space and the second wall; an inlet opening configured to allow a flow of gas from a gas source to enter the gap from outside the space; and an outlet opening configured to allow the flow of gas to exit the gap to outside of the space, wherein the system is configured to direct the flow of gas to enter the gap through the inlet opening, to flow through the gap and out of the gap to outside the space through the outlet opening thereby to reduce thermal fluctuations in the space due to the thermal load originating outside the space.
Public/Granted literature
- US09921497B2 Lithographic apparatus and device manufacturing method Public/Granted day:2018-03-20
Information query
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