Invention Application
US20160271750A1 RETAINING RING FOR LOWER WAFER DEFECTS 审中-公开
用于较低波形缺陷的保持环

RETAINING RING FOR LOWER WAFER DEFECTS
Abstract:
A retaining ring and a chemical mechanical planarization system (CMP) are disclosed. In one embodiment, a retaining ring for a polishing system includes a ring-shaped body having a polished inner diameter. The body has a bottom surface having grooves formed therein, an outer diameter wall, and an inner diameter wall, wherein the inner diameter wall is polished to a roughness average (Ra) of less than about 30 microinches (μin).
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