Invention Application
- Patent Title: RETAINING RING FOR LOWER WAFER DEFECTS
- Patent Title (中): 用于较低波形缺陷的保持环
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Application No.: US15074089Application Date: 2016-03-18
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Publication No.: US20160271750A1Publication Date: 2016-09-22
- Inventor: Yongqi HU , Simon YAVELBERG , Gangadhar SHEELAVANT , Kadthala R. NARENDRNATH
- Applicant: Applied Materials, Inc.
- Main IPC: B24B37/32
- IPC: B24B37/32

Abstract:
A retaining ring and a chemical mechanical planarization system (CMP) are disclosed. In one embodiment, a retaining ring for a polishing system includes a ring-shaped body having a polished inner diameter. The body has a bottom surface having grooves formed therein, an outer diameter wall, and an inner diameter wall, wherein the inner diameter wall is polished to a roughness average (Ra) of less than about 30 microinches (μin).
Public/Granted literature
- US10399202B2 Retaining ring for lower wafer defects Public/Granted day:2019-09-03
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