Invention Application
US20150338474A1 INTEGRATED DUAL AXIS FLUXGATE SENSOR USING DOUBLE DEPOSITION OF MAGNETIC MATERIAL
有权
使用双重沉积磁性材料的集成双轴FLUXGATE传感器
- Patent Title: INTEGRATED DUAL AXIS FLUXGATE SENSOR USING DOUBLE DEPOSITION OF MAGNETIC MATERIAL
- Patent Title (中): 使用双重沉积磁性材料的集成双轴FLUXGATE传感器
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Application No.: US14286517Application Date: 2014-05-23
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Publication No.: US20150338474A1Publication Date: 2015-11-26
- Inventor: Anuraag Mohan , Dok Won Lee , William French , Erika L. Mazotti
- Applicant: Texas Instruments Incorporated
- Main IPC: G01R33/09
- IPC: G01R33/09 ; H01L43/12 ; H01L29/26 ; H01L43/00
Abstract:
A method of fabricating fluxgate devices to measure the magnetic field in two orthogonal, in plane directions, by using a composite-anisotropic magnetic core structure.
Public/Granted literature
- US09383418B2 Integrated dual axis fluxgate sensor using double deposition of magnetic material Public/Granted day:2016-07-05
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