Invention Application
- Patent Title: NANODOT CHARGE STORAGE STRUCTURES AND METHODS
- Patent Title (中): NANODOT充电储存结构和方法
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Application No.: US14021705Application Date: 2013-09-09
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Publication No.: US20140010018A1Publication Date: 2014-01-09
- Inventor: Jaydeb Goswami
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: H01L27/11
- IPC: H01L27/11

Abstract:
Methods, devices, and systems associated with charge storage structures in semiconductor devices are described herein. In one or more embodiments, a method of forming nanodots includes forming at least a portion of a charge storage structure over a material by reacting a single-source precursor and a reactant, where the single-source precursor includes a metal and a semiconductor.
Public/Granted literature
- US09397105B2 Nanodot charge storage structures Public/Granted day:2016-07-19
Information query
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