Invention Application
US20120306018A1 BEOL STRUCTURES INCORPORATING ACTIVE DEVICES AND MECHANICAL STRENGTH
有权
包含有效装置的BEOL结构和机械强度
- Patent Title: BEOL STRUCTURES INCORPORATING ACTIVE DEVICES AND MECHANICAL STRENGTH
- Patent Title (中): 包含有效装置的BEOL结构和机械强度
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Application No.: US13149797Application Date: 2011-05-31
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Publication No.: US20120306018A1Publication Date: 2012-12-06
- Inventor: Stephen M. Gates , Daniel C. Edelstein , Satyanarayana V. Nitta
- Applicant: Stephen M. Gates , Daniel C. Edelstein , Satyanarayana V. Nitta
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: H01L29/772
- IPC: H01L29/772 ; H01L29/92 ; H01L21/20 ; H01L29/02

Abstract:
A monolithic integrated circuit and method includes a substrate, a plurality of semiconductor device layers monolithically integrated on the substrate, and a metal wiring layer with vias interconnecting the plurality of semiconductor device layers. The semiconductor device layers are devoid of bonding or joining interface with the substrate. A method of fabricating a monolithic integrated circuit using a single substrate, includes fabricating semiconductor devices on a substrate, fabricating at least one metal wiring layer on the semiconductor devices, forming at least one dielectric layer in integral contact with the at least one metal wiring layer, forming contact openings through the at least one dielectric layer to expose regions of the at least one metal wiring layer, integrally forming, from the substrate, a second semiconductor layer on the dielectric layer, and in contact with the at least one metal wiring layer through the contact openings, and forming a plurality of non-linear semiconductor devices in said second semiconductor layer.
Public/Granted literature
- US08624323B2 BEOL structures incorporating active devices and mechanical strength Public/Granted day:2014-01-07
Information query
IPC分类: