发明申请
- 专利标题: METHOD FOR FABRICATING MOS TRANSISTOR
- 专利标题(中): 制造MOS晶体管的方法
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申请号: US13084564申请日: 2011-04-12
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公开(公告)号: US20120264267A1公开(公告)日: 2012-10-18
- 发明人: Tsuo-Wen Lu , Gin-Chen Huang , Shao-Wei Wang , Yu-Ren Wang , Ya-Chi Cheng
- 申请人: Tsuo-Wen Lu , Gin-Chen Huang , Shao-Wei Wang , Yu-Ren Wang , Ya-Chi Cheng
- 主分类号: H01L21/336
- IPC分类号: H01L21/336
摘要:
A method of fabricating a MOS transistor includes the steps of: providing a substrate; forming a gate structure on the substrate; forming a first spacer on the sidewall of the gate structure and forming at least a recess within the substrate next to the first spacer; performing an oxygen-containing process to form an oxygen-containing layer on the surface of the recess; performing a cleaning process to remove the oxygen-containing layer; performing an epitaxial process to form an epitaxial layer in the recess; and removing the first spacer.
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