发明申请
US20120255193A1 SUBSTRATE DRYING APPARATUS AND METHOD 审中-公开
基板干燥装置和方法

  • 专利标题: SUBSTRATE DRYING APPARATUS AND METHOD
  • 专利标题(中): 基板干燥装置和方法
  • 申请号: US13518631
    申请日: 2010-12-07
  • 公开(公告)号: US20120255193A1
    公开(公告)日: 2012-10-11
  • 发明人: Akitake Tamura
  • 申请人: Akitake Tamura
  • 申请人地址: JP Tokyo
  • 专利权人: TOKYO ELECTRON LIMITED
  • 当前专利权人: TOKYO ELECTRON LIMITED
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2009-295503 20091225
  • 国际申请: PCT/JP10/71855 WO 20101207
  • 主分类号: F26B25/00
  • IPC分类号: F26B25/00
SUBSTRATE DRYING APPARATUS AND METHOD
摘要:
A substrate drying apparatus which dries a substrate cleaned by a diamagnetic liquid includes a magnet unit for moving the liquid adhering to the substrate by means of a magnetic force; and a magnet transfer mechanism for moving the magnet unit along the substrate toward an edge of the substrate. A substrate drying method of drying a substrate cleaned by a diamagnetic liquid includes bringing a magnet unit close to the substrate, the magnet unit being configured to move the liquid adhering to the substrate by means of a magnetic force; and moving the magnet unit along the substrate toward the edge of the substrate.
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