Invention Application
- Patent Title: Nitride semiconductor substrate and manufacturing method thereof
- Patent Title (中): 氮化物半导体衬底及其制造方法
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Application No.: US12002338Application Date: 2007-12-14
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Publication No.: US20080142846A1Publication Date: 2008-06-19
- Inventor: Doo-Soo Kim , Ho-Jun Lee , Yong-Jin Kim , Dong-Kun Lee
- Applicant: Doo-Soo Kim , Ho-Jun Lee , Yong-Jin Kim , Dong-Kun Lee
- Assignee: SILTRON INC.
- Current Assignee: SILTRON INC.
- Priority: KR10-2006-0129128 20061218
- Main IPC: H01L29/267
- IPC: H01L29/267 ; H01L21/205

Abstract:
The present invention relates to a nitride semiconductor substrate such as gallium nitride substrate and a method for manufacturing the same. The present invention forms a plurality of trenches on a lower surface of a base substrate that are configured to absorb or reduce stresses applied larger when growing a nitride semiconductor film on the base substrate from a central portion of the base substrate towards a peripheral portion. That is, the present invention forms the trenches on the lower surface of the base substrate such that pitches get smaller or widths or depths get larger from the central portion of the base substrate towards the peripheral portion.
Public/Granted literature
- US07915698B2 Nitride semiconductor substrate having a base substrate with parallel trenches Public/Granted day:2011-03-29
Information query
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