Invention Application
- Patent Title: SEMICONDUCTOR PROCESS
- Patent Title (中): 半导体工艺
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Application No.: US11564850Application Date: 2006-11-30
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Publication No.: US20080132023A1Publication Date: 2008-06-05
- Inventor: Yi-Wei Chen , Chao-Ching Hsieh , Tsai-Fu Hsiao , Yu-Lan Chang , Tsung-Yu Hung , Chun-Chieh Chang
- Applicant: Yi-Wei Chen , Chao-Ching Hsieh , Tsai-Fu Hsiao , Yu-Lan Chang , Tsung-Yu Hung , Chun-Chieh Chang
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/71
- IPC: H01L21/71 ; H01L21/04

Abstract:
A semiconductor process is provided. The semiconductor process includes providing a substrate. Then, a surface treatment is performed to the substrate to form a buffer layer on the substrate. Next, a first pre-amorphous implantation is performed to the substrate.
Public/Granted literature
- US07892935B2 Semiconductor process Public/Granted day:2011-02-22
Information query
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