Invention Application
US20070103964A1 Resistive memory devices including selected reference memory cells and methods of operating the same
审中-公开
电阻式存储器件包括所选择的参考存储单元及其操作方法
- Patent Title: Resistive memory devices including selected reference memory cells and methods of operating the same
- Patent Title (中): 电阻式存储器件包括所选择的参考存储单元及其操作方法
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Application No.: US11580766Application Date: 2006-10-13
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Publication No.: US20070103964A1Publication Date: 2007-05-10
- Inventor: Hyun-Jo Kim , Kyung-Tae Nam , In-Gyu Baek , Se-Chung Oh , Jang-Eun Lee , Jun-Ho Jeong
- Applicant: Hyun-Jo Kim , Kyung-Tae Nam , In-Gyu Baek , Se-Chung Oh , Jang-Eun Lee , Jun-Ho Jeong
- Priority: KR2005-0107178 20051109
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A method of accessing a resistive memory device can include applying a predetermined voltage level to a first word line coupled to a first resistive memory cell block during a read operation of a second resistive memory cell block coupled to a second word line, A programming current can be conducted via a pair of opposing current source transistors located on first and second opposing sides of the first block to provide the programming current from the first end to the second end across bit lines coupled to resistive memory cells in the first block and to provide the programming current parallel to the second block.
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