发明申请
- 专利标题: Connector for testing a semiconductor package
- 专利标题(中): 用于测试半导体封装的连接器
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申请号: US11295208申请日: 2005-12-05
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公开(公告)号: US20060121757A1公开(公告)日: 2006-06-08
- 发明人: Young-Bae Chung , Hyun-Seop Shim , Jeong-Ho Bang , Jae-Il Lee , Hyun-Kyo Seo , Young-Soo An , Soon-Geol Hwang
- 申请人: Young-Bae Chung , Hyun-Seop Shim , Jeong-Ho Bang , Jae-Il Lee , Hyun-Kyo Seo , Young-Soo An , Soon-Geol Hwang
- 优先权: KR2004-101799 20041206
- 主分类号: H01R4/58
- IPC分类号: H01R4/58
摘要:
In one embodiment, a connector is made using a mixture of insulating silicone powder and conductive powder. The connector comprises a connector body formed from the insulating silicone powder and on or more preferably regularly arrayed conductive silicone members that are formed by migrating the conductive powder to a site of the connector corresponding to a solder ball of the semiconductor package. The conductive silicone member comprises a high-density conductive silicone part formed to be proximate an upper surface of the connector body and to protrude therefrom and a low-density conductive silicone part formed in substantial vertical alignment beneath the high-density conductive silicone part, the low-density conductive silicone part having a lower surface exposed from a lower surface of the connector body.
公开/授权文献
- US07438563B2 Connector for testing a semiconductor package 公开/授权日:2008-10-21
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