Invention Application
US20050246599A1 System and method for testing input and output characterization on an integrated circuit device
审中-公开
在集成电路设备上测试输入和输出特性的系统和方法
- Patent Title: System and method for testing input and output characterization on an integrated circuit device
- Patent Title (中): 在集成电路设备上测试输入和输出特性的系统和方法
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Application No.: US10836931Application Date: 2004-04-30
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Publication No.: US20050246599A1Publication Date: 2005-11-03
- Inventor: Neil Simpson , Rakesh Kumar
- Applicant: Neil Simpson , Rakesh Kumar
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/317
Abstract:
A system for testing input characteristics of an integrated circuit device includes an integrated circuit device. The integrated circuit device includes, an input pad, an output pad, an input register, and a data register. The input register receives an input value from the input pad and communicates the input value to a portion of the integrated circuit for processing when the integrated circuit is not in test mode. The data register receives a test value from the input register and communicates the test value to the output pad when the integrated circuit is in test mode.
Information query
