- 专利标题: Bias voltage generation in an optical measurement system
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申请号: US17202613申请日: 2021-03-16
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公开(公告)号: US12085789B2公开(公告)日: 2024-09-10
- 发明人: Ryan Field , Jacob Dahle , Rong Jin , Alex Borisevich , Sebastian Sorgenfrei , Bruno Do Valle
- 申请人: HI LLC
- 申请人地址: US CA Los Angeles
- 专利权人: HI LLC
- 当前专利权人: HI LLC
- 当前专利权人地址: US CA Culver City
- 代理机构: ALG Intellectual Property, LLC
- 主分类号: G02F1/01
- IPC分类号: G02F1/01 ; A61B5/00 ; G01J1/42 ; G01J1/44 ; H04B10/50
摘要:
An exemplary optical measurement system described herein includes a control circuit configured to output a global bias voltage and a module communicatively coupled to the control circuit. The module includes a light source configured to emit light directed at a target. The module further includes a plurality of detectors configured to detect arrival times for photons of the light after the light is scattered by the target. The module further includes a module control circuit configured to receive the global bias voltage and output a plurality of detector bias voltages based on the global bias voltage. The plurality of detector bias voltages include a respective detector bias voltage for each detector of the plurality of detectors.
公开/授权文献
- US20210294129A1 Bias Voltage Generation in an Optical Measurement System 公开/授权日:2021-09-23
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