- 专利标题: Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
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申请号: US15073084申请日: 2016-03-17
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公开(公告)号: US12040179B2公开(公告)日: 2024-07-16
- 发明人: Takaaki Noda , Kotaro Konno , Shingo Nohara , Takeo Hanashima
- 申请人: HITACHI KOKUSAI ELECTRIC INC.
- 申请人地址: JP Tokyo
- 专利权人: KOKUSAI ELECTRIC CORPORATION
- 当前专利权人: KOKUSAI ELECTRIC CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Volpe Koenig
- 优先权: JP 15063487 2015.03.25
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; C23C16/40 ; C23C16/455 ; H01J37/32
摘要:
A technique of manufacturing a semiconductor device includes forming a film on a substrate in a process chamber by supplying a precursor and a reactant to the substrate under a first temperature at which the precursor and the reactant are not pyrolyzed, and purging, after performing the act of forming the film, an interior of the process chamber by supplying at least one selected from a group consisting of a plasma-excited gas, an alcohol, and a reducing agent into the process chamber under a second temperature equal to or lower than the first temperature.
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