- 专利标题: Method of manufacturing semiconductor products, semiconductor product, device and testing method
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申请号: US17158781申请日: 2021-01-26
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公开(公告)号: US12021052B2公开(公告)日: 2024-06-25
- 发明人: Fulvio Vittorio Fontana
- 申请人: STMicroelectronics S.r.l.
- 申请人地址: IT Agrate Brianza
- 专利权人: STMicroelectronics S.r.l.
- 当前专利权人: STMicroelectronics S.r.l.
- 当前专利权人地址: IT Agrate Brianza
- 代理机构: Crowe & Dunlevy LLC
- 优先权: IT 2020000001729 2020.01.29
- 主分类号: H01L21/56
- IPC分类号: H01L21/56 ; G01N21/956 ; H01L23/00 ; H01L23/31 ; H01L25/065
摘要:
A semiconductor product includes a layer of semiconductor die package molding material embedding a semiconductor die having a front surface and an array of electrically-conductive bodies such as spheres or balls around the semiconductor die. The electrically-conductive bodies have front end portions around the front surface of the semiconductor die and back end portions protruding from the layer of semiconductor die package molding material. Electrically-conductive formations are provided between the front surface of the semiconductor die and front end portions of the electrically-conductive bodies left uncovered by the package molding material. Light-permeable sealing material can be provided at electrically-conductive formations to facilitate inspecting the electrically-conductive formations via visual inspection through the light-permeable sealing material.
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