- 专利标题: Methods of forming interconnect circuits
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申请号: US17383129申请日: 2021-07-22
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公开(公告)号: US11979976B2公开(公告)日: 2024-05-07
- 发明人: Kevin Michael Coakley , Malcolm Parker Brown , Dongao Yang , Michael Lawrence Miller , Paul Henry Lego
- 申请人: CelLink Corporation
- 申请人地址: US CA San Carlos
- 专利权人: CelLink Corporation
- 当前专利权人: CelLink Corporation
- 当前专利权人地址: US CA San Carlos
- 代理机构: Polygon IP, LLP
- 主分类号: H05K3/20
- IPC分类号: H05K3/20 ; H01M50/519 ; H05K1/02 ; H05K1/11 ; H05K3/00 ; H05K3/06 ; H05K3/28 ; H05K3/46 ; H05K3/04 ; H05K3/44
摘要:
Provided are interconnect circuits and methods of forming thereof. A method may involve laminating a substrate to a conductive layer followed by patterning the conductive layer. This patterning operation forms individual conductive portions, which may be also referred to as traces or conductive islands. The substrate supports these portions relative to each other during and after patterning. After patterning, an insulator may be laminated to the exposed surface of the patterned conductive layer. At this point, the conductive layer portions are also supported by the insulator, and the substrate may optionally be removed, e.g., together with undesirable portions of the conductive layer. Alternatively, the substrate may be retained as a component of the circuit and the undesirable portions of the patterned conductive layer may be removed separately. These approaches allow using new patterning techniques as well as new materials for substrates and/or insulators.
公开/授权文献
- US20210352798A1 INTERCONNECT CIRCUIT METHODS AND DEVICES 公开/授权日:2021-11-11
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