A first error is determined between a bandgap reference output voltage of a bandgap reference circuit at a first temperature and a target voltage. A second temperature of the bandgap reference circuit is measured. A bandgap reference output voltage of the bandgap reference circuit is predicted at the second temperature and based on the first error. A second error is determined between the bandgap reference output voltage and the target voltage. A trim parameter of the bandgap reference circuit is determined based on the second error. The bandgap reference circuit is set with the trim parameter, where a third error between a bandgap reference output voltage of the bandgap reference with the trim parameter is less than the second error.