- 专利标题: Positive electrode of crystalline silicon solar cell having gate rupture prevention function
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申请号: US17262690申请日: 2019-07-23
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公开(公告)号: US11817511B2公开(公告)日: 2023-11-14
- 发明人: Kang-Cheng Lin , Mingzhang Feng , Jiebin Fang , Gang Chen
- 申请人: Zhejiang Aiko Solar Energy Technology Co., Ltd. , Guangdong Aiko Solar Energy Technology Co., Ltd.
- 申请人地址: CN Zhejiang
- 专利权人: Zhejiang Aiko Solar Energy Technology Co., Ltd.,Guangdong Aiko Solar Energy Technology Co., Ltd.
- 当前专利权人: Zhejiang Aiko Solar Energy Technology Co., Ltd.,Guangdong Aiko Solar Energy Technology Co., Ltd.
- 当前专利权人地址: CN Zhejiang; CN Guangdong
- 代理机构: Seed IP Law Group LLP
- 优先权: CN 1810816451.0 2018.07.24
- 国际申请: PCT/CN2019/097297 2019.07.23
- 国际公布: WO2020/020158A 2020.01.30
- 进入国家日期: 2021-03-23
- 主分类号: H01L31/0224
- IPC分类号: H01L31/0224 ; H01L31/068
摘要:
Disclosed is a positive electrode of a crystalline silicon solar cell with a break-proof grid function, comprising a positive electrode busbar (1), a positive electrode grid (2), and a break-proof grid structure (3). The break-proof grid structure (3) and the positive electrode grid (2) are integrally printed and formed. The break-proof grid structure (3) is an octagon with a hollow-out groove (4) provided on its rear side. The break-proof grid structure (3) includes a rectangular grid segment (31) located in the middle, and two isosceles trapezoidal grid segments (32) that are located at both sides of the rectangular grid segment (31) and are provided symmetrically with the rectangular grid segment (31) as a center. The rectangular grid segment (31) spans the positive electrode busbar (1), and the left and right ends of the rectangular grid segment (31) extend out of the positive electrode busbar (1). The extended grid segment is a rectangular extensional break-proof grid segment (311). Both ends of the isosceles trapezoidal grid segment (32) respectively are in contact with the extensional break-proof grid segment (311) and the positive electrode grid (2). The hollow-out groove (4) is located within the isosceles trapezoidal grid segment (32) or spans the extensional break-proof grid segment (311) and the isosceles trapezoidal grid segment (32). A break-proof grid design in the positive electrode employs the combination of the octagon and the hollow-out groove, and can effectively reduce the probability of grid breakage when the front-side electrode is printed.
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