Invention Grant
- Patent Title: Method for fabricating semiconductor device with heat dissipation features
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Application No.: US17746030Application Date: 2022-05-17
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Publication No.: US11728316B2Publication Date: 2023-08-15
- Inventor: Shing-Yih Shih
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agent Xuan Zhang
- The original application number of the division: US17158337 2021.01.26
- Main IPC: H01L25/00
- IPC: H01L25/00 ; H01L25/065 ; H01L25/18 ; H01L23/498 ; H01L21/48

Abstract:
The present application provides a method for fabricating a semiconductor device. The method includes providing a carrier substrate, forming through semiconductor vias in the carrier substrate for thermally conducting heat, forming a bonding layer on the carrier substrate, providing a first die structure including through semiconductor vias, forming an intervening bonding layer on the first die structure, bonding the first die structure onto the bonding layer through the intervening bonding layer, and bonding a second die structure onto the first die structure. The carrier substrate, the through semiconductor vias, and the bonding layer together configure a carrier structure. The second die structure and the first die structure are electrically coupled by the through semiconductor vias.
Public/Granted literature
- US20220278078A1 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH HEAT DISSIPATION FEATURES Public/Granted day:2022-09-01
Information query
IPC分类: