- 专利标题: Semiconductor device and method of manufacturing
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申请号: US16945224申请日: 2020-07-31
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公开(公告)号: US11658245B2公开(公告)日: 2023-05-23
- 发明人: Shyh-Shin Ferng
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Slater Matsil, LLP
- 主分类号: H01L29/786
- IPC分类号: H01L29/786 ; H01L27/11 ; H01L29/66 ; H01L27/146 ; H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/45 ; H01L21/02 ; H01L21/306 ; H01L21/285
摘要:
Gate-all-around (GAA) devices and methods of manufacturing such devices are described herein. A method includes forming a multi-layer structure over a substrate and forming a plurality of source/drain regions in the multi-layer structure. Fins are then patterned into the multi-layer structure through adjacent source/drain regions. A wire release process is performed to remove materials of one or more of the layers in the multi-layer stack. The remaining layers of the multi-layer stack form a stack of nanostructures connecting adjacent source/drain regions of the fins.
公开/授权文献
- US20210126134A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING 公开/授权日:2021-04-29
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