- 专利标题: Photoresist composition
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申请号: US15371702申请日: 2016-12-07
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公开(公告)号: US11561471B2公开(公告)日: 2023-01-24
- 发明人: Masako Sugihara , Takashi Nishimura , Hiromu Sakamoto
- 申请人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 申请人地址: JP Tokyo
- 专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人地址: JP Tokyo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JPJP2015-239949 20151209
- 主分类号: G03F7/039
- IPC分类号: G03F7/039 ; G03F7/30 ; G03F7/38 ; C08F220/28 ; C08F220/18
摘要:
A photoresist composition comprising:
a resin which has a structural unit represented by formula (I): wherein R1 represents a hydrogen atom, a halogen atom, or a C1 to C6 alkyl group which optionally has a halogen atom, and R2 represents a C1 to C42 hydrocarbon group which optionally has a substituent; an alkali-soluble resin;
an acid generator; and
a solvent.
a resin which has a structural unit represented by formula (I): wherein R1 represents a hydrogen atom, a halogen atom, or a C1 to C6 alkyl group which optionally has a halogen atom, and R2 represents a C1 to C42 hydrocarbon group which optionally has a substituent; an alkali-soluble resin;
an acid generator; and
a solvent.
公开/授权文献
- US20170168393A1 PHOTORESIST COMPOSITION 公开/授权日:2017-06-15
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