- 专利标题: Charged particle beam device, autofocus processing method of charged particle beam device, and detector
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申请号: US17280661申请日: 2018-10-25
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公开(公告)号: US11538659B2公开(公告)日: 2022-12-27
- 发明人: Mitsuhiro Nakamura , Michio Hatano
- 申请人: Hitachi High-Tech Corporation
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Tech Corporation
- 当前专利权人: Hitachi High-Tech Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 国际申请: PCT/JP2018/039624 WO 20181025
- 国际公布: WO2020/084729 WO 20200430
- 主分类号: H01J37/21
- IPC分类号: H01J37/21 ; H01J37/20 ; H01J37/244 ; H01J37/26
摘要:
Provided are a charged particle beam device and a detector capable of non-invasively observing a biochemical sample without a staining treatment or an immobilization treatment, with a simple and high observation throughput. An electron optics system, a stage 64, a sample chamber 100 holding a sample and including a first insulating layer 110 that is in contact with the sample, and a conductive layer 120 that is formed on the first insulating layer, signal detection circuits 20 and 50 connected to the conductive layer and detecting a current flowing through the conductive layer, and a main control unit 14 for controlling the electron optics system and the stage, wherein the main control unit 14 irradiates the conductive layer of the sample chamber placed on the stage with an electron beam from the electron optics system and is input with a detection signal from the signal detection circuit.
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