发明授权
- 专利标题: Substrate processing method, storage medium, and substrate processing apparatus
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申请号: US17385387申请日: 2021-07-26
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公开(公告)号: US11480881B2公开(公告)日: 2022-10-25
- 发明人: Yusaku Hashimoto , Kouichirou Tanaka , Masahiro Fukuda , Atsushi Ookouchi
- 申请人: Tokyo Electron Limited
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Nath, Goldberg & Meyer
- 代理商 Jerald L. Meyer; Tanya E. Harkins
- 优先权: JPJP2020-127488 20200728
- 主分类号: G03F7/16
- IPC分类号: G03F7/16
摘要:
A method of processing a substrate includes: performing a first developing process of moving a nozzle having one end surface and a discharge port opened at the end surface while making the end surface come into contact with a developer on a front surface of a substrate in a state in which the nozzle is disposed so that the end surface faces the front surface and the developer is discharged from the discharge port at a first flow rate while rotating the substrate; and after the first developing process, performing a second developing process of discharging the developer from the discharge port at a second flow rate higher than the first flow rate in a state in which the end surface is in contact with the developer on the front surface at a position facing a center of the front surface of the substrate while rotating the substrate.
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