- 专利标题: Automated system and methodology for feature extraction
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申请号: US17063255申请日: 2020-10-05
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公开(公告)号: US11417081B2公开(公告)日: 2022-08-16
- 发明人: Yandong Wang , Frank Giuffrida
- 申请人: Pictometry International Corp.
- 申请人地址: US NY Rochester
- 专利权人: Pictometry International Corp.
- 当前专利权人: Pictometry International Corp.
- 当前专利权人地址: US NY Rochester
- 代理机构: Dunlap Codding, P.C.
- 主分类号: G06K9/62
- IPC分类号: G06K9/62 ; G06V10/44 ; G06V10/56 ; G06V20/64 ; G06V20/10 ; G06T7/50 ; G06T7/73 ; G06K9/00
摘要:
Automated methods and systems for feature extraction are disclosed, including automated methods performed by at least one processor running computer executable instructions stored on at least one non-transitory computer readable medium, comprising determining and isolating an object of interest within a point cloud; forming a modified point cloud having one or more data points with first location coordinates of the object of interest; and generating a boundary outline having second location coordinates of the object of interest using spectral analysis of at least one section of at least one image identified with the first location coordinates and depicting the object of interest.
公开/授权文献
- US20210089805A1 AUTOMATED SYSTEM AND METHODOLOGY FOR FEATURE EXTRACTION 公开/授权日:2021-03-25
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