- 专利标题: Protruding gate transistor and method of producing same
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申请号: US16679343申请日: 2019-11-11
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公开(公告)号: US11349034B2公开(公告)日: 2022-05-31
- 发明人: Kyeongill Yoon , Yongchul Oh
- 申请人: XIA TAI XIN SEMICONDUCTOR (QING DAO) LTD.
- 申请人地址: CN Qingdao
- 专利权人: XIA TAI XIN SEMICONDUCTOR (QING DAO) LTD.
- 当前专利权人: XIA TAI XIN SEMICONDUCTOR (QING DAO) LTD.
- 当前专利权人地址: CN Qingdao
- 代理机构: ScienBiziP, P.C.
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L29/786 ; H01L29/423 ; H01L29/78
摘要:
A structure of a protruding gate transistor is disclosed. The protruding gate transistor comprising a substrate, a source region, a drain region, a channel extension anchor, a channel layer, and gate structure. The gate structure comprising a gate insulator layer, and a gate conductor layer. The channel layer is formed to be protruding from the substrate to extend the length of the channel of the protruding gate transistor and alleviate from channel length modulation.
公开/授权文献
- US20210143283A1 PROTRUDING GATE TRANSISTOR AND METHOD OF PRODUCING SAME 公开/授权日:2021-05-13
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