- 专利标题: Machine learning based methods and apparatus for integrated circuit design delay calculation and verification
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申请号: US17111218申请日: 2020-12-03
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公开(公告)号: US11341304B2公开(公告)日: 2022-05-24
- 发明人: Madhusudan Raman , Nizar Abdallah , Julien G. Dunoyer
- 申请人: Microchip Technology Inc.
- 申请人地址: US AZ Chandler
- 专利权人: Microchip Technology Inc.
- 当前专利权人: Microchip Technology Inc.
- 当前专利权人地址: US AZ Chandler
- 代理机构: Glass and Associates
- 代理商 Kenneth Glass
- 主分类号: G06F30/343
- IPC分类号: G06F30/343 ; G06F119/12 ; G06N3/08
摘要:
A method for integrated circuit design with delay verification includes storing configuration files for a slew-rate Machine Learning (ML) model, a net-delay ML model and a cell-delay ML model. A user design is received, slew-rate feature values, net-delay feature values and cell-delay feature values are extracted from the user design, the configuration files are loaded to form inference cores, and operations of the slew-rate inference core are performed to calculate predicted slew-rate values that are sent to ML design tools. Operations of the net-delay inference core are performed to calculate predicted net-delay values that are sent to the ML design tools. Operations of the cell-delay inference core are performed to generate predicted cell-delay values that are sent to the ML design tools. The user design is iterated until a user design is obtained that is free of timing violations.
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