- 专利标题: Substrate treating apparatus and substrate treating method
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申请号: US16174683申请日: 2018-10-30
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公开(公告)号: US11244847B2公开(公告)日: 2022-02-08
- 发明人: Harutyun Melikyan , Jong Hwan An , Jamyung Gu , Sang-Kee Lee , Young Bin Kim , Shin-Woo Nam
- 申请人: SEMES CO., LTD.
- 申请人地址: KR Chungcheongnam-do
- 专利权人: SEMES CO., LTD.
- 当前专利权人: SEMES CO., LTD.
- 当前专利权人地址: KR Chungcheongnam-do
- 代理机构: Carter, DeLuca & Farrell LLP
- 优先权: KR10-2017-0142658 20171030
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/683 ; H01L21/687 ; H01L21/66 ; H01J37/32 ; H01J37/244 ; H01L21/67
摘要:
Disclosed is a substrate treating apparatus. The substrate treating apparatus includes a chamber having a treatment space in the interior thereof, a support unit configured to support a substrate in the treatment space, a gas supply unit configured to supply a gas into the treatment space, and a plasma generating unit configured to generate plasma from the gas, wherein the support unit includes an electrostatic chuck including an upper body having a support surface that suctions the substrate and a lower body extending from the upper body to a lower side, wherein the lower body has an extension part extending laterally from the upper body, a focus ring disposed on the extension part of the electrostatic chuck, and a metallic ring provided between the upper body of the electrostatic chuck and the focus ring and configured to control plasma in an extreme edge of the substrate.
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