- 专利标题: Recording medium recording via lifetime calculation program, via lifetime calculation method, and information processing device
-
申请号: US16239978申请日: 2019-01-04
-
公开(公告)号: US10929585B2公开(公告)日: 2021-02-23
- 发明人: Mitsunori Abe , Yoshiyuki Hiroshima , Takahiro Kitagawa , Naoki Nakamura , Akiko Matsui
- 申请人: FUJITSU LIMITED
- 申请人地址: JP Kawasaki
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki
- 代理机构: Fujitsu Patent Center
- 优先权: JPJP2018-004655 20180116
- 主分类号: G06F30/367
- IPC分类号: G06F30/367 ; H05K1/11 ; G01R31/28 ; H05K3/00
摘要:
A recording medium recording a program for a process, the process includes: calculating an amount of distortion in a via of a printed circuit board based on an expression using coefficient m, Δε={(L×α×Δt×E)/(D×T)}×m, where Δε is the amount of distortion, L is a length of the via, α is a thermal expansion coefficient of a base material, Δt is a temperature change of an environment, E is a Young's modulus, D is a diameter of the via, and T is a thickness of plating in the via; and calculating a lifetime of the via based on an expression, M=N/(n×365), where M is the lifetime of the via, n is a frequency of the temperature change, and N is the number of cycles of the lifetime satisfying an expression Nx=C/Δε.
公开/授权文献
信息查询