- 专利标题: Testing solid state devices before completing manufacture
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申请号: US15897879申请日: 2018-02-15
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公开(公告)号: US10784172B2公开(公告)日: 2020-09-22
- 发明人: Cody Michael Berger , Ramana Tadepalli
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Rose Alyssa Keagy; Charles A. Brill; Frank D. Cimino
- 主分类号: G01R31/18
- IPC分类号: G01R31/18 ; H01L29/24 ; G01R31/26 ; H01L29/778 ; H01L21/66 ; H01L29/20 ; H01L29/205 ; H01L29/40 ; H01L29/66 ; H01L29/16
摘要:
In some examples, a method for manufacturing a solid state device comprises forming a first layer of the solid state device; forming a conductive layer of the solid state device above the first layer, the conductive layer having an access pad formed on an end of the conductive layer; applying a voltage to the conductive layer using the access pad, the voltage forming an electric field in an area of the first layer beneath the conductive layer; and completing manufacture of the solid state device after applying the voltage.
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