- 专利标题: Semiconductor device having a buried layer
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申请号: US15902158申请日: 2018-02-22
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公开(公告)号: US10546920B2公开(公告)日: 2020-01-28
- 发明人: Andreas Meiser , Ralf Rudolf
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 代理机构: Murphy, Bilak & Homiller, PLLC
- 优先权: DE102017103782 20170223
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L21/265 ; H01L21/74 ; H01L21/761 ; H01L29/10
摘要:
A semiconductor device includes a semiconductor substrate of a first conductivity type. A first semiconductor layer of a second conductivity type is on the semiconductor substrate. A buried semiconductor layer of the second conductivity type is on the first semiconductor layer. A second semiconductor layer of the second conductivity type is on the buried semiconductor layer. A trench extends through each of the second semiconductor layer, the buried semiconductor layer, and the first semiconductor layer, and into the semiconductor substrate. An insulating structure lines walls of the trench. A conductive filling in the trench is electrically coupled to the semiconductor substrate at a bottom of the trench.
公开/授权文献
- US20180240868A1 Semiconductor Device Having a Buried Layer 公开/授权日:2018-08-23
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