发明授权
- 专利标题: Semiconductor device with common active area and method for manufacturing the same
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申请号: US15939876申请日: 2018-03-29
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公开(公告)号: US10510776B2公开(公告)日: 2019-12-17
- 发明人: Jack Liu , Jiann-Tyng Tzeng , Chih-Liang Chen , Chew-Yuen Young , Sing-Kai Huang , Ching-Fang Huang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT, P.C., Intellectual Property Attorneys
- 代理商 Anthony King
- 主分类号: H01L27/12
- IPC分类号: H01L27/12 ; H01L21/761 ; H01L21/84 ; H01L21/762 ; H01L29/10
摘要:
A semiconductor device includes a substrate, a pair of transistor devices and an isolation region. The pair of transistor devices are disposed over the substrate. Each of the pair of the transistor devices includes a channel, a gate electrode over the channel, and a source/drain region alongside the gate electrode. The isolation region is disposed between the source/drain regions of the pair of the transistor devices. The isolation region has a first doping type opposite to a second doping type of the source/drain regions.
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