发明授权
- 专利标题: Inspection system
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申请号: US15448487申请日: 2017-03-02
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公开(公告)号: US10417754B2公开(公告)日: 2019-09-17
- 发明人: Yuki Kimura , Akira Matsui , Shingo Inazumi
- 申请人: OMRON Corporation
- 申请人地址: JP Kyoto
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Knobbe, Martens, Olson & Bear, LLP
- 优先权: JP2016-130458 20160630
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; G06T7/00 ; B25J9/00 ; G01N21/88 ; G01B11/10 ; G01B11/24 ; G01N21/95 ; G01N21/952 ; G01B11/14 ; G01B11/245
摘要:
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device; the inspection device including: a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough; and a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
公开/授权文献
- US20180005365A1 INSPECTION SYSTEM 公开/授权日:2018-01-04
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