Invention Grant
- Patent Title: Decoupling finFET capacitors
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Application No.: US15389173Application Date: 2016-12-22
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Publication No.: US10396217B2Publication Date: 2019-08-27
- Inventor: Chung-Hui Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L49/02 ; H01L29/94 ; H01L29/66 ; H01L27/08 ; H01L27/06 ; H01L27/088 ; H01L29/78 ; H01L27/12

Abstract:
A semiconductor device including field-effect transistors (finFETs) and fin capacitors are formed on a silicon substrate. The fin capacitors include silicon fins, one or more electrical conductors between the silicon fins, and insulating material between the silicon fins and the one or more electrical conductors. The fin capacitors may also include insulating material between the one or more electrical conductors and underlying semiconductor material.
Public/Granted literature
- US20170104106A1 DECOUPLING FINFET CAPACITORS Public/Granted day:2017-04-13
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