- 专利标题: Connector structure and method of forming same
-
申请号: US15589315申请日: 2017-05-08
-
公开(公告)号: US10388620B2公开(公告)日: 2019-08-20
- 发明人: Chen-Shien Chen , Sheng-Yu Wu , Mirng-Ji Lii , Chita Chuang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater Matsil, LLP
- 主分类号: H01L23/52
- IPC分类号: H01L23/52 ; H01L23/00
摘要:
Connector structures and methods of forming the same are provided. A method includes forming a first patterned passivation layer on a workpiece, the first patterned passivation layer having a first opening exposing a conductive feature of the workpiece. A seed layer is formed over the first patterned passivation layer and in the first opening. A patterned mask layer is formed over the seed layer, the patterned mask layer having a second opening exposing the seed layer, the second opening overlapping with the first opening. A connector is formed in the second opening. The patterned mask layer is partially removed, an unremoved portion of the patterned mask layer remaining in the first opening. The seed layer is patterned using the unremoved portion of the patterned mask layer as a mask.
公开/授权文献
- US20170243846A1 Connector Structure and Method of Forming Same 公开/授权日:2017-08-24
信息查询
IPC分类: