- 专利标题: Semiconductor device and method for fabricating the same
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申请号: US15871059申请日: 2018-01-14
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公开(公告)号: US10340284B2公开(公告)日: 2019-07-02
- 发明人: Sung Gil Kim , Seul Ye Kim , Hong Suk Kim , Jin Tae Noh , Ji Hoon Choi , Jae Young Ahn
- 申请人: Sung Gil Kim , Seul Ye Kim , Hong Suk Kim , Jin Tae Noh , Ji Hoon Choi , Jae Young Ahn
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Renaissance IP Law Group LLP
- 优先权: KR10-2017-0085703 20170706
- 主分类号: H01L27/115
- IPC分类号: H01L27/115 ; H01L27/11582 ; H01L23/532 ; H01L27/108 ; H01L23/00 ; H01L29/06 ; H01L25/065
摘要:
A stack structure includes conductive layer patterns and interlayer insulating layer patterns alternately stacked on one another. A channel hole penetrates the stack structure. A dielectric layer is disposed on a sidewall of the channel hole. A channel layer is disposed on the dielectric layer and in the channel hole. A passivation layer is disposed on the channel layer and in the channel hole. The channel layer is interposed between the passivation layer and the dielectric layer. An air gap is surrounded by the passivation layer. A width of the air gap is larger than a width of the passivation layer.
公开/授权文献
- US20190013328A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 公开/授权日:2019-01-10
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