- 专利标题: Quality inspection data distributed ledger
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申请号: US16031956申请日: 2018-07-10
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公开(公告)号: US10257496B2公开(公告)日: 2019-04-09
- 发明人: Raf Peeters , Bert Peelaers
- 申请人: Qcify Inc.
- 申请人地址: US CA San Mateo
- 专利权人: Qcify Inc.
- 当前专利权人: Qcify Inc.
- 当前专利权人地址: US CA San Mateo
- 代理机构: Imperium Patent Works LLP
- 代理商 Mark D. Marrello
- 主分类号: H04N13/243
- IPC分类号: H04N13/243 ; G06T7/00 ; H04N5/232 ; H04N13/254 ; H04N5/247 ; H04N5/225
摘要:
A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.
公开/授权文献
- US20180324407A1 QUALITY INSPECTION DATA DISTRIBUTED LEDGER 公开/授权日:2018-11-08
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