Invention Grant
- Patent Title: Electrical probe with a probe head and contacting pins
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Application No.: US15497840Application Date: 2017-04-26
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Publication No.: US10254310B2Publication Date: 2019-04-09
- Inventor: Mao-Sheng Liu , Hsiu-Wei Kuo
- Applicant: CHROMA ATE INC.
- Applicant Address: TW Taoyuan
- Assignee: CHROMA ATE INC.
- Current Assignee: CHROMA ATE INC.
- Current Assignee Address: TW Taoyuan
- Agency: Maschoff Brennan
- Priority: TW105114208A 20160506
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/00 ; G01R1/073

Abstract:
An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.
Public/Granted literature
- US20170322235A1 ELECTRICAL PROBE Public/Granted day:2017-11-09
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