Systems, methods, and apparatuses for fault tolerance and detection are described. For example, an apparatus including circuitry to replicate input sources of an instruction; arithmetic logic unit (ALU) circuitry to execute the instruction with replicated input sources using single instruction, multiple data (SIMD) hardware to produce a packed data result; and comparison circuitry coupled to the ALU circuitry to evaluate the packed data result and output a singular data result into a destination of the instruction is described.